共找到 150 條與 溫度穩定性 相關的標準，共 10 頁
This standard specifies a method of determining the temperature stability of paints, oils and varnishes at high or low temperatures, or during one
Paints and varnishes - Temperature stability
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Test method for effects of temperature on stability of geotextiles
1. 本標準規定地工織物受溫度影響穩定性之試驗方法。1.1 本標準所包含之試驗步驟，系用以決定溫度對地工織物抗拉強度及伸長率之影響。1.2 本標準對于溫度影響之穩定性應在標準狀態之地工織物在埋設現場之預期狀況下進行測試，報告時，須以兩者在刺拉強度及伸長率之穩定性表
Method of Test for Effects of Temperatures on Stability of Geotextiles
Seminar on Temperature Stable Electrical Insulation Materials
This test method is used for evaluating the relative effects of temperature on geotextiles manufactured from different polymers, by a different
Standard Test Method for Effects of Temperature on Stability of Geotextiles
IEC/TR 62518. The temperature stability of rare earth sintered magnets
TESTING METHOD FOR EFFECTS OF TEMPERATURE STABILITY OF GEOSYNTHETICS
本標準規定了壓電陶瓷振子頻率溫度穩定性的測試方法。 本標準適用于測試圓片徑向伸縮振動模式，長條橫向長度伸縮振動模式的壓電陶瓷振子的串聯諧振頻率和并聯諧振頻率（以下簡稱頻率）的溫度穩定性
Test method for frequency temperature stability of piezoelectric ceramic vibrator
TESTING METHOD FOR EFFECTS OF TEMPERATURE STABILITY OF GEOSYNTHETICS
Test Method for Determining the Temperature Stability of Automotive Trim Materials
This test method provides an indication of thermal oxidative stability of distillate fuels when heated to high temperatures that simulate those
Standard Test Method for High Temperature Stability of Middle Distillate Fuels
Testing of lubricants and related products - Determination of the temperature stability of turbine oils
This International Standard provides a test procedure for a bias-temperature (BT) stability test of metal-oxide semiconductor, field-effect
Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)
This International Standard provides a test procedure for a bias-temperature (BT) stability test of metal-oxide semiconductor, field-effect
Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)
This International Standard provides a test procedure for a bias-temperature (BT) stability test of metal-oxide semiconductor, field-effect
Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET) (IEC 62373:2006); German version EN 62373:2006
